DepthLM: Metric Depth from Vision Language Models - cai, zhipeng; Yeh, Ching-Feng; Xu, Hu; Liu, Zhuang; Meyer, Gregory P.; Lei, Xinjie; Zhao, Changsheng; Li, Shang-Wen; Chandra, Vikas; Shi, Yangyang (International Conference on Learning Representations, 2026)